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Proceedings Paper

Cadmium zinc telluride high-resolution detector technology
Author(s): Arnold Burger; Henry Chen; Kaushik Chattopadhyay; Jean-Olivier Ndap; Stephen U. Egarievwe; Ralph B. James
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Paper Abstract

Electrode contacting on semiconductor radiation detectors has been a topic of active interest in many recent investigations. Research activities have focused on the morphology and chemistry of modified surfaces using sophisticated preparation techniques and employing characterization methods that are able to discriminate between surface and bulk effects. From an applied point of view, the detector fabrication technology involves a series of fabrication steps which can be optimized. Results of an ongoing effort to improve the performance of high resolution CdxZn1-xTe spectrometers by addressing wafer surface preparation, electrode deposition and contact passivation are described.

Paper Details

Date Published: 1 July 1998
PDF: 5 pages
Proc. SPIE 3446, Hard X-Ray and Gamma-Ray Detector Physics and Applications, (1 July 1998); doi: 10.1117/12.312886
Show Author Affiliations
Arnold Burger, Fisk Univ. (United States)
Henry Chen, Fisk Univ. (United States)
Kaushik Chattopadhyay, Fisk Univ. (United States)
Jean-Olivier Ndap, Fisk Univ. (United States)
Stephen U. Egarievwe, Fisk Univ. (United States)
Ralph B. James, Sandia National Labs. (United States)

Published in SPIE Proceedings Vol. 3446:
Hard X-Ray and Gamma-Ray Detector Physics and Applications
F. Patrick Doty; Richard B. Hoover, Editor(s)

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