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Proceedings Paper

Surface study of laser-induced charge gratings in Bi12SiO20 with an atomic force microscope
Author(s): E. Soergel; W. Krieger; Valentin I. Vlad
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Paper Abstract

Light-induced charge gratings at the surface of a photorefractive Bi12SiO20 crystal are investigated using electrostatic force detection with an atomic force microscope. The gratings with periods of 2.7 micrometers and 0.22 micrometers are generated by two intersecting Ar+-laser beams at 514 nm. The dark decay times of the stored gratings are determined. Saturation processes are directly observed by a change of the profile of the charge gratings. The polarity of the charge carriers in the material is obtained using a simultaneous measurement of the light-intensity grating.

Paper Details

Date Published: 2 July 1998
PDF: 7 pages
Proc. SPIE 3405, ROMOPTO '97: Fifth Conference on Optics, (2 July 1998); doi: 10.1117/12.312786
Show Author Affiliations
E. Soergel, Max-Planck-Institut fuer Quantenoptik (Germany)
W. Krieger, Max-Planck-Institut fuer Quantenoptik (Germany)
Valentin I. Vlad, Institute of Atomic Physics (Romania)

Published in SPIE Proceedings Vol. 3405:
ROMOPTO '97: Fifth Conference on Optics
Valentin I. Vlad; Dan C. Dumitras, Editor(s)

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