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Proceedings Paper

Yield optimization of multilayer optical coating by modeling of the monitoring process
Author(s): G. L. Muscalu
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Paper Abstract

In this paper, one investigated the yield of some optical coatings with a nonquarterwave structure within the classical vacuum systems by modeling of the monitoring process. The correlation of the synthesis and modeling process, allows to set the optimum monitoring process for different types of coatings. The experimental results tested on antireflection coatings are according to the theoretical ones.

Paper Details

Date Published: 2 July 1998
PDF: 6 pages
Proc. SPIE 3405, ROMOPTO '97: Fifth Conference on Optics, (2 July 1998); doi: 10.1117/12.312732
Show Author Affiliations
G. L. Muscalu, S.C. Pro Optica SA (Romania)


Published in SPIE Proceedings Vol. 3405:
ROMOPTO '97: Fifth Conference on Optics
Valentin I. Vlad; Dan C. Dumitras, Editor(s)

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