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Proceedings Paper

Spectroellipsometric characterization of multilayer systems containing Ni and Bi
Author(s): V. Hutsanu; Mariuca Gartner; Constantin Ghita; Voicu Dolocan
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Paper Abstract

In this paper an optical evaluation of the system Ni,Bi/Cu,ITO/glass system, prepared by electrochimical method is presented. Among various factors that affect the optical and structural properties of the multistructure systems we focus on the influence of the substrate and the interfacial oxidic layers. To this end we used the Spectroellipsometric (SE) method in VIS- NIR spectral range. The SE results show that the electrochemical deposited films (Ni,Bi) are porous and their refractive index depends strongly on the substrate.

Paper Details

Date Published: 2 July 1998
PDF: 4 pages
Proc. SPIE 3405, ROMOPTO '97: Fifth Conference on Optics, (2 July 1998); doi: 10.1117/12.312682
Show Author Affiliations
V. Hutsanu, Univ. of Bucharest (Romania)
Mariuca Gartner, Institute of Physical Chemistry (Romania)
Constantin Ghita, Institute of Physical Chemistry (Romania)
Voicu Dolocan, Univ. of Bucharest (Romania)

Published in SPIE Proceedings Vol. 3405:
ROMOPTO '97: Fifth Conference on Optics
Valentin I. Vlad; Dan C. Dumitras, Editor(s)

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