Share Email Print

Proceedings Paper

Characterization of ion-exchanged waveguides from near-field measurements
Author(s): Daniel Pircalaboiu; Gabriella Motta; Guido Perrone; Ivo Montrosset
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The refractive index distribution is a key parameter not only to characterize the technological process but also for any integrated optical simulator. In this paper we propose a new algorithm to reconstruct the refractive index profile from the near-field measurements. The technique is based on the matching of the measured intensity profile with a computed one, varying the maximum index change and the diffusion depth.

Paper Details

Date Published: 2 July 1998
PDF: 4 pages
Proc. SPIE 3405, ROMOPTO '97: Fifth Conference on Optics, (2 July 1998); doi: 10.1117/12.312678
Show Author Affiliations
Daniel Pircalaboiu, Politecnico di Torino and Univ. of Bucharest (Romania)
Gabriella Motta, Politecnico di Torino (Italy)
Guido Perrone, Politecnico di Torino (Italy)
Ivo Montrosset, Politecnico di Torino (Italy)

Published in SPIE Proceedings Vol. 3405:
ROMOPTO '97: Fifth Conference on Optics
Valentin I. Vlad; Dan C. Dumitras, Editor(s)

© SPIE. Terms of Use
Back to Top