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Proceedings Paper

Characterization of integrated optical waveguides based on oxidized porous silicon
Author(s): M. Balucani; V. Bondarenko; N. Kasuchits; G. Lamedica; N. Vorozov; A. Ferrari
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Paper Abstract

Integrated optical waveguides based on oxidized porous silicon were fabricated by means of traditional silicon technology. Near- field pattern and out-of-plane scattering losses were measured to characterize optical properties of the waveguides. Strong confinement of light within the core of the waveguides as well as optical losses of about 5 dB/cm have been demonstrated in the visible range. The achieved results make the waveguides promising in optoelectronics use.

Paper Details

Date Published: 2 July 1998
PDF: 6 pages
Proc. SPIE 3405, ROMOPTO '97: Fifth Conference on Optics, (2 July 1998); doi: 10.1117/12.312660
Show Author Affiliations
M. Balucani, INFM and Univ. degli Studi di Roma La Sapienza (Italy)
V. Bondarenko, Univ. degli Studi di Roma La Sapienza (Italy)
N. Kasuchits, Belarusian State Univ. of Informatics and Radioelectronics (Belarus)
G. Lamedica, INFM and Univ. degli Studi di Roma La Sapienza (Italy)
N. Vorozov, Belarusian State Univ. of Informatics and Radioelectronics (Belarus)
A. Ferrari, INFM and Univ. degli Studi di Roma La Sapienza (Italy)


Published in SPIE Proceedings Vol. 3405:
ROMOPTO '97: Fifth Conference on Optics
Valentin I. Vlad; Dan C. Dumitras, Editor(s)

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