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Proceedings Paper

Modeling of optical properties in multilayer optical storage media
Author(s): Vasyliy G. Kravets; Andrey A. Kryuchin; Tatyana G. Karpeleva; Ekaterina L. Vinnichenko; Alexander V. Prygun
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Paper Abstract

A computer model has been developed to calculate the optical properties (reflection and absorption coefficient) for various dye thicknesses between 20 and 300 nm for situation various reflecting layer Au or Al (Si). For a high k dye to power absorption being very critically dependent on dye thicknesses. In the less absorbing dye the situation be more extreme, with oscillatory interference effects causing considerable variations in absorption (reflection) from a maximum to a minimum every 50 - 70 nm (Au) and 100 - 120 nm (Al), and 150 nm (Si). A series of calculations are presented on a number of different layer structures and materials in an attempt to optimize the storage medium.

Paper Details

Date Published: 9 June 1998
PDF: 8 pages
Proc. SPIE 3282, Photosensitive Optical Materials and Devices II, (9 June 1998); doi: 10.1117/12.311535
Show Author Affiliations
Vasyliy G. Kravets, Institute for Information Recording Problems (Ukraine)
Andrey A. Kryuchin, Institute for Information Recording Problems (Ukraine)
Tatyana G. Karpeleva, Institute for Information Recording Problems (Ukraine)
Ekaterina L. Vinnichenko, Institute for Information Recording Problems (Ukraine)
Alexander V. Prygun, Institute for Information Recording Problems (Ukraine)


Published in SPIE Proceedings Vol. 3282:
Photosensitive Optical Materials and Devices II
Mark P. Andrews, Editor(s)

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