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Proceedings Paper

High-performance thin-film transistors with low-high-low bandgap engineering
Author(s): Chun-Yen Chang; Yeong-Shyang Lee; Po-Sheng Shih; Chiung-Wei Lin
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Paper Abstract

A novel high-performance thin-film transistor (TFT) with low-high-low band gap structure is proposed. We propose a novel device structure combined with low-band-gap materials for the channel region, high-band-gap materials for the source and drain offset regions, and heavily doped low-band- gap materials for ohmic contact of source and drain electrodes. We found that, as compared to a-Si:H TFT device with conventional inverted-stagger structures, the device with low-band-gap materials in the channel which possesses high conductance can effectively improve the film quality of initial growth active layer near the gate insulator interface and the grown layer. Hence the TFT device parameters such as field effect mobility, threshold voltage, subthreshold swing and ON-current have been significantly improved. This proposed novel structure with high-band-gap material is used to prevent the band to band tunneling and alleviate the high OFF-current in conventional (mu) c-Si:H thin-film transistors. The proposed high performance TFTs with low-high-low band gap structure will have a great impact in application to high resolution thin-film transistor liquid-crystal displays and active-matrix liquid- crystal displays.

Paper Details

Date Published: 17 June 1998
PDF: 7 pages
Proc. SPIE 3421, Display Technologies II, (17 June 1998); doi: 10.1117/12.311058
Show Author Affiliations
Chun-Yen Chang, National Chiao Tung Univ. (Taiwan)
Yeong-Shyang Lee, National Chiao Tung Univ. (Taiwan)
Po-Sheng Shih, National Chiao Tung Univ. (Taiwan)
Chiung-Wei Lin, National Chiao Tung Univ. (Taiwan)


Published in SPIE Proceedings Vol. 3421:
Display Technologies II
Fang-Chen Luo; Shin-Tson Wu; Shunsuke Kobayashi, Editor(s)

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