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Proceedings Paper

Short-period x-ray multilayers
Author(s): S. S. Andreev; A. A. Fraerman; Kiril A. Prokhorov; Nikolai N. Salashchenko; E. A. Shamov; S. A. Zuev; F. Schafers
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Paper Abstract

Ultrathin Cr/Sc-multilayers were systematically investigated using tuneable soft x-ray synchrotron and x-ray tube radiation. The multilayers were optimized either for use in normal incidence or at 45 degrees at photon energies around the L-absorption edges of Sc (399 eV) and Cr (574 eV), respectively, and K-absorption edge of C (283 eV). The high reflectivity of the multilayer mirrors allows to use them for the creation of multi-mirror systems for x-ray astronomy and microscopy and x-ray diagnostics of high-temperature plasma.

Paper Details

Date Published: 25 June 1998
PDF: 10 pages
Proc. SPIE 3406, Current Russian Research in Optics and Photonics: New Methods and Instruments for Space- and Earth-based Spectroscopy in XUV, UV, IR, and Millimeter Waves, (25 June 1998); doi: 10.1117/12.310984
Show Author Affiliations
S. S. Andreev, Institute for Physics of Microstructures (Russia)
A. A. Fraerman, Institute for Physics of Microstructures (Russia)
Kiril A. Prokhorov, Institute for Physics of Microstructures (Russia)
Nikolai N. Salashchenko, Institute for Physics of Microstructures (Russia)
E. A. Shamov, Institute for Physics of Microstructures (Russia)
S. A. Zuev, Institute for Physics of Microstructures (Russia)
F. Schafers, BESSY GmbH (Germany)


Published in SPIE Proceedings Vol. 3406:
Current Russian Research in Optics and Photonics: New Methods and Instruments for Space- and Earth-based Spectroscopy in XUV, UV, IR, and Millimeter Waves
Igor I. Sobelman; Vladimir A. Slemzin, Editor(s)

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