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Proceedings Paper

Microscopy using an interference pattern as illumination source
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Paper Abstract

We describe a method of obtaining optically scanned fluorescence images in a widefield conventional microscope by interfering two beams on an object so as to illuminate it with a single spatial frequency fringe pattern. Images taken at three spatial positions of the fringe pattern are processed in real time to produce optically sectioned images which are substantially similar to those obtained with confocal microscopes.

Paper Details

Date Published: 9 June 1998
PDF: 2 pages
Proc. SPIE 3261, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing V, (9 June 1998); doi: 10.1117/12.310568
Show Author Affiliations
Rimas Juskaitis, Univ. of Oxford (United Kingdom)
Mark A. A. Neil, Univ. of Oxford (United Kingdom)
Tony Wilson, Univ. of Oxford (United Kingdom)


Published in SPIE Proceedings Vol. 3261:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing V
Thomas Taiwei Lu; Jeremy M. Lerner; Carol J. Cogswell; Jose-Angel Conchello; Jeremy M. Lerner; Thomas Taiwei Lu; Tony Wilson, Editor(s)

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