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Proceedings Paper

Advances and useful applications of Raman spectroscopy, imaging, and remote sensing
Author(s): Andrew Whitley; Steven M. Barnett
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Paper Abstract

Recent improvements in filters, multi-element detectors and instrument design have transformed Raman spectroscopy from a difficult to use specialist technique into a widely used multi-dimensional spectroscopic method. Raman spectroscopy is non destructive and offers a spatial resolution of one micro or better. A Raman spectrum gives specific information regarding the chemical bonding of molecules and can therefore be used to identify different molecules in a system. Through the use of xyz mapping techniques, specific types of material can be imaged in living cells, drug formulations and polymer mixtures to give but a few examples. Raman technologies allow areas as large as 500 microns to be imaged directly using filters tuned specifically to look for a particular chemical species. The Raman technique uses visible or close to visible light which is ideal for coupling into optical fibers. It is therefore very easy to build ruggedized spectrometers using fiber optic probes for remote sensing in extremely difficult and/or hazardous environments; for example process monitoring and recently endoscopic diagnostic work in living subjects. This paper will describe the methodology used in direct Raman imaging, Raman mapping experiments and remote sensing with reference to specific examples of biological, pharmaceutical, mineral and crystal studies.

Paper Details

Date Published: 9 June 1998
PDF: 10 pages
Proc. SPIE 3261, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing V, (9 June 1998); doi: 10.1117/12.310560
Show Author Affiliations
Andrew Whitley, Renishaw Inc. (United States)
Steven M. Barnett, Renishaw Inc. (United States)


Published in SPIE Proceedings Vol. 3261:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing V
Thomas Taiwei Lu; Carol J. Cogswell; Jeremy M. Lerner; Jose-Angel Conchello; Jeremy M. Lerner; Thomas Taiwei Lu; Tony Wilson, Editor(s)

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