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Proceedings Paper

Improved optical method for measurement of AFM cantilever deflection
Author(s): Vil B. Baiburin; Nikolai P. Konnov; Yuri P. Volkov
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Paper Abstract

In our lab we have developed an atomic force microscope (AFM) for biological and technical applications with improved optical method for measuring of cantilever with an additional lens placed between cantilever and four-segment photodiode. The lens forms an image of the cantilever in the photodiode plane. Small sizes of the cantilever image improve the resolution of AFM and reduce the requirements to the optical scheme of the microscope. The lens nonlinear transmission of the cantilever deflection is compensated by means of computer program. With the AFM were imaged the DNA of plague microbes and phages of plague and V. Cholera.

Paper Details

Date Published: 9 June 1998
PDF: 6 pages
Proc. SPIE 3261, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing V, (9 June 1998); doi: 10.1117/12.310552
Show Author Affiliations
Vil B. Baiburin, Saratov Technical Univ. (Russia)
Nikolai P. Konnov, Russian Research Anti-Plague Institute Microbe (Russia)
Yuri P. Volkov, Saratov Technical Univ. (Russia)


Published in SPIE Proceedings Vol. 3261:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing V
Thomas Taiwei Lu; Carol J. Cogswell; Jeremy M. Lerner; Jose-Angel Conchello; Jeremy M. Lerner; Thomas Taiwei Lu; Tony Wilson, Editor(s)

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