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Proceedings Paper

Materials for reflective multilayer coatings for EUV wavelengths
Author(s): Bruce W. Smith; Parthasarathy Venkataraman; Santosh K. Kurinec; R. Scott Mackay
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Paper Abstract

By operating at wavelength near 10-20 nm, EUV lithography can allow for imaging below 100 nm with limited diffractive losses. The reflective optics involved in such systems require multilayer coatings with stringent demands on throughput, uniformity, and stability. The performance of such multilayers is dependent on the optical properties leading to multilayer stacks requiring up to 40 layer pairs. An exhaustive study of potential material combinations has been performed. Detailed results from the investigation of candidate EUV reflective multilayers is presented. Beryllium and silicon are unique in the 10 to 20 nm wavelength range as materials with high index values and suitably low absorption. The best performing coatings within this range are therefore combinations of these two materials with low absorbing low index films, including many refractory metals. For each multilayer coating type investigated, the wavelength of maximum reflectivity has been optimized, and stress, thickness variation, scattering, and interfacial layer formation effects have been characterized.

Paper Details

Date Published: 5 June 1998
PDF: 11 pages
Proc. SPIE 3331, Emerging Lithographic Technologies II, (5 June 1998); doi: 10.1117/12.309614
Show Author Affiliations
Bruce W. Smith, Rochester Institute of Technology (United States)
Parthasarathy Venkataraman, Rochester Institute of Technology (United States)
Santosh K. Kurinec, Rochester Institute of Technology (United States)
R. Scott Mackay, SEMATECH (United States)


Published in SPIE Proceedings Vol. 3331:
Emerging Lithographic Technologies II
Yuli Vladimirsky, Editor(s)

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