Share Email Print

Proceedings Paper

Performance limitations from Coulomb interaction in maskless parallel electron-beam lithography systems
Author(s): Liqun Han; Mark A. McCord; Gil Israel Winograd; Roger Fabian W. Pease
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Proposed high throughput maskless multi-parallel electron beam systems require a large current, which can also potentially destroy the imaging quality due to Coulomb interaction effects. By using a Monte Carlo approach, we have studied the beam current limitation set by Coulomb interaction among electrons at 0.1 micrometers resolution under a variety of column lengths and acceleration voltages for both a blanker aperture array system and a photocathode system. By taking into account the limits from the resist sensitivity and the freedom of system parameter selection, the throughput performance is evaluated in terms of an upper limit and a lower limit, and the feasible system configurations are suggested for achieving the desired throughput as well as 0.1 micrometers resolution. Some results for SCALPEL are also obtained, and the comparison of different lithography tools are discussed.

Paper Details

Date Published: 5 June 1998
PDF: 10 pages
Proc. SPIE 3331, Emerging Lithographic Technologies II, (5 June 1998); doi: 10.1117/12.309583
Show Author Affiliations
Liqun Han, Stanford Univ. (United States)
Mark A. McCord, Stanford Univ. (United States)
Gil Israel Winograd, Stanford Univ. (United States)
Roger Fabian W. Pease, Stanford Univ. (United States)

Published in SPIE Proceedings Vol. 3331:
Emerging Lithographic Technologies II
Yuli Vladimirsky, Editor(s)

© SPIE. Terms of Use
Back to Top