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Proceedings Paper

exVis: a visual analysis tool for wind tunnel data
Author(s): D. Glenn Deardorff; Leslie E. Keeley; Samuel P. Uselton
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Paper Abstract

exVis is a software tool created to support interactive display and analysis of data collected during wind tunnel experiments. It is a result of a continuing project to explore the uses of information technology in improving the effectiveness of aeronautical design professionals. The data analysis goals are accomplished by allowing aerodynamicists to display and query data collected by new data acquisition systems and to create traditional wind tunnel plots from this data by interactively interrogating these images. exVis was built as a collection of distinct modules to allow for rapid prototyping, to foster evolution of capabilities, and to facilitate object reuse within other applications being developed. It was implemented using C++ and Open Inventor, commercially available object-oriented tools. The initial version was composed of three main classes. Two of these modules are autonomous viewer objects intended to display the test images (ImageViewer) and the plots (GraphViewer). The third main class is the Application User Interface (AUI) which manages the passing of data and events between the viewers, as well as providing a user interface to certain features. User feedback was obtained on a regular basis, which allowed for quick revision cycles and appropriately enhanced feature sets. During the development process additional classes were added, including a color map editor and a data set manager. The ImageViewer module was substantially rewritten to add features and to use the data set manager. The use of an object-oriented design was successful in allowing rapid prototyping and easy feature addition.

Paper Details

Date Published: 14 May 1998
PDF: 9 pages
Proc. SPIE 3298, Visual Data Exploration and Analysis V, (14 May 1998); doi: 10.1117/12.309531
Show Author Affiliations
D. Glenn Deardorff, MRJ Technology Solutions/NASA Ames Research Ctr. (United States)
Leslie E. Keeley, MRJ Technology Solutions/NASA Ames Research Ctr. (United States)
Samuel P. Uselton, MRJ Technology Solutions/NASA Ames Research Ctr. (United States)

Published in SPIE Proceedings Vol. 3298:
Visual Data Exploration and Analysis V
Robert F. Erbacher; Alex Pang, Editor(s)

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