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Proceedings Paper

Stability and lifetime improvements of UV fibers for new applications
Author(s): Karl-Friedrich Klein; Stefan Huettel; Ralf Kaminski; Johannes Kirchhof; Stephan Grimm; Gary W. Nelson
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Paper Abstract

Two years ago, UV-improved (UVI) fibers were described for the first time. These fibers show significantly reduced UV- absorption around 215 nm during the transmission of UV-light from different UV-sources like deuterium-lamps, excimer- lasers and frequency-doubled tunable dye lasers. This improvement has been realized due to a passivation of the generated UV-defects by gas-doping. Depending on the ambient temperature and the fiber diameter, the lifetime of UV- stability was quite different in these first generation UVI- fibers. This long-term behavior has been studied with different illuminations, temperatures and fiber diameters; there is a good agreement between experimental and theoretical data. Additional modifications have lead to a further improvement in the long-term stability. The predicted lifetime of these UVI2-fibers of the second generation at room temperature is longer than 1 year. In addition, a short-term behavior was observed using diode- array spectrometer. In this case, the influence of temperature on the transient induced losses is significant and will be described.

Paper Details

Date Published: 5 June 1998
PDF: 11 pages
Proc. SPIE 3262, Surgical-Assist Systems, (5 June 1998); doi: 10.1117/12.309468
Show Author Affiliations
Karl-Friedrich Klein, Fachhochschule Giessen-Friedberg (Germany)
Stefan Huettel, Fachhochschule Giessen-Friedberg (Germany)
Ralf Kaminski, Fachhochschule Giessen-Friedberg (Germany)
Johannes Kirchhof, IPHT Jena (Germany)
Stephan Grimm, IPHT Jena (Germany)
Gary W. Nelson, Polymicro Technology (United States)


Published in SPIE Proceedings Vol. 3262:
Surgical-Assist Systems
Roger Von Hanwehr; Marilyn Sue Bogner; Steven T. Charles; Abraham Katzir; Marilyn Sue Bogner; Steven T. Charles; James A. Harrington; Warren S. Grundfest; Louis S. Lome; Warren S. Grundfest; James A. Harrington; Abraham Katzir; Louis S. Lome; Michael W. Vannier; Roger Von Hanwehr, Editor(s)

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