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Proceedings Paper

Efficient numerical method for characterizing diffraction gratings
Author(s): Rene Somas; Laurent Bigue; Pierre Ambs
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Paper Abstract

The complete knowledge of geometrical parameters of a periodically modulated material is of great scientific interest, because it allows the user to determine the diffracted image. The modulation profile or the thickness of a phase holographic grating are two of these parameters. They can be determined a posteriori by the measurement of the intensities distribution over different orders, with a comparison of the theoretical and measured angular or spectral selectivities. This method involves a large number of measurements. We propose a new approach, which most of the time needs only one measurement of intensity and polarization (for each of the diffracted orders). The great advantage of the method is the processing of tedious tasks by computers.

Paper Details

Date Published: 22 May 1998
PDF: 5 pages
Proc. SPIE 3490, Optics in Computing '98, (22 May 1998); doi: 10.1117/12.308855
Show Author Affiliations
Rene Somas, Univ. de Haute Alsace (France)
Laurent Bigue, Univ. de Haute Alsace (France)
Pierre Ambs, Univ. de Haute Alsace (France)


Published in SPIE Proceedings Vol. 3490:
Optics in Computing '98
Pierre H. Chavel; David A. B. Miller; Hugo Thienpont, Editor(s)

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