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Proceedings Paper

Possibility of excitation temperature determination by relative deviation plot of line intensities
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Paper Abstract

Method of relative deviation plot of line intensities for LTE presence verification and excitation temperature determination is suggested and analyzed. This method seems to be attractive as it does not require the values of the Einstein constants Aji of spontaneous emission.

Paper Details

Date Published: 26 May 1998
PDF: 4 pages
Proc. SPIE 3404, ALT'97 International Conference on Laser Surface Processing, (26 May 1998); doi: 10.1117/12.308648
Show Author Affiliations
Alexandre F. Semerok, CEA Saclay (France)


Published in SPIE Proceedings Vol. 3404:
ALT'97 International Conference on Laser Surface Processing
Vladimir I. Pustovoy, Editor(s)

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