Share Email Print
cover

Proceedings Paper

High-intensity-laser post-ionization mass spectrometry for uniform and ultrasensitive surface analysis
Author(s): Chun He; Christopher H. Becker
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

High intensity nonresonant multiphoton ionization has been used in conjunction with time-of-flight mass spectrometry to perform highly sensitive, quantitative, chemical analysis. To achieve quantification of all elements simultaneously and obtain uniform detection efficiencies, all species, regardless of ionization potentials, should be saturated in a single, well-defined volume. To aid in this analysis, 3D potentials intensity distributions of high power laser beams were imaged at a nd near their focus. The cross-sectional intensity distributions of the fundamental and higher order harmonics of a 35-ps Nd:YAG laser beam showed near Gaussian profiles. For nonresonant multiphoton ionization of sputtered or gaseous atoms and molecules, high laser beam quality combined with high power density led not only to photo-ionization saturation of species with quite different ionization potentials, but also to sharply defined ionization volumes. Experiments were performed on the nonresonant multiphoton ionization of species from solid samples and from gaseous samples using well-characterized, high intensity laser beams. The result, driving relative sensitivity factors almost to unity, demonstrate quantitative compositional analysis.

Paper Details

Date Published: 15 May 1998
PDF: 9 pages
Proc. SPIE 3270, Methods for Ultrasensitive Detection, (15 May 1998); doi: 10.1117/12.308381
Show Author Affiliations
Chun He, SRI International (United States)
Christopher H. Becker, SRI International (United States)


Published in SPIE Proceedings Vol. 3270:
Methods for Ultrasensitive Detection
Bryan L. Fearey, Editor(s)

© SPIE. Terms of Use
Back to Top