Share Email Print
cover

Proceedings Paper

Trapped ions, entanglement, and quantum computing
Author(s): Christopher John Myatt; B. E. King; D. Kielpinski; D. Leibfried; Q. A. Turchette; C. S. Wood; Wayne M. Itano; Christopher R. Monroe; David J. Wineland
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A miniature, elliptical ring rf ion trap has been sued in recent experiments toward realizing a quantum computer in a trapped ion system. With the combination of small spatial dimensions and high rf drive potentials, around 500 V amplitude, we have achieved secular oscillation frequencies in the range of 5-20 MHz. The equilibrium positions of pairs of ions that are crystallized in this trap lie along the long axis of the ellipse. By adding a static potential to the trap, the micromotion of two crystallized ions may be reduced relative to the case of pure rf confinement. The presence of micromotion reduces the strength of internal transitions in the ion, an effect that is characterized by a Debye-Waller factor, in analogy with the reduction of Bragg scattering at finite temperature in a crystal lattice. We have demonstrated the dependence of the rates of internal transitions on the amplitude of micromotion, and we propose a scheme to use this effect to differentially address the ions.

Paper Details

Date Published: 15 May 1998
PDF: 7 pages
Proc. SPIE 3270, Methods for Ultrasensitive Detection, (15 May 1998); doi: 10.1117/12.308371
Show Author Affiliations
Christopher John Myatt, National Institute of Standards and Technology (United States)
B. E. King, National Institute of Standards and Technology (United States)
D. Kielpinski, National Institute of Standards and Technology (United States)
D. Leibfried, National Institute of Standards and Technology (United States)
Q. A. Turchette, National Institute of Standards and Technology (United States)
C. S. Wood, National Institute of Standards and Technology (United States)
Wayne M. Itano, National Institute of Standards and Technology (United States)
Christopher R. Monroe, National Institute of Standards and Technology (United States)
David J. Wineland, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 3270:
Methods for Ultrasensitive Detection
Bryan L. Fearey, Editor(s)

© SPIE. Terms of Use
Back to Top