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Proceedings Paper

FAST-Net optical interconnection prototype demonstration program
Author(s): Michael W. Haney; Marc P. Christensen; P. Milojkovik; Jeremy T. Ekman; Premanand Chandramani; Richard G. Rozier; Fouad E. Kiamilev; Yue Liu; Mary K. Hibbs-Brenner; Jim Nohava; Edith Kalweit; Sommy Bounnak; Terry Marta; B. Walterson
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Paper Abstract

This paper reports progress toward the experimental demonstration of a smart pixel based optical interconnection prototype currently being developed under the Free-space Accelerator for Switching Terabit Networks (FAST-Net) project. The prototype system incorporates 2D arrays of monolithically integrated high- bandwidth vertical cavity surface emitting lasers (VCSELs) and photodetectors (PDs). A key aspect of the FAST-Net concept is that all smart pixels are distributed across a single multi-chip plane. This plane is connected to itself via an optical system that consists of an array of matched lenses (one for each smart pixel chip position) and a mirror. The optical interconnect system implements a global point-to-point shuffle pattern. The interleaved 2D arrays of VCSELs and PDs in the prototype are arranged on a clustered self-similar grid pattern with a closest element pitch of 100 micrometers . The circular VCSEL elements have a diameter of 10 micrometers and the square PDs have an active region that is 50 micrometers wide. These arrays are packaged and mounted on circuit boards along with the CMOS driver, receiver, and FPGA controller chips. Micro-positioning mounts are used to effect alignment that is consistent with current MCM chip placement accuracy. Shuffled optical data links between the multiple ICs have been demonstrated in preliminary evaluation of this system. These results suggest that a multi-Terabit optically interconnected MCM module is feasible.

Paper Details

Date Published: 5 May 1998
PDF: 10 pages
Proc. SPIE 3288, Optoelectronic Interconnects V, (5 May 1998); doi: 10.1117/12.307576
Show Author Affiliations
Michael W. Haney, George Mason Univ. (United States)
Marc P. Christensen, George Mason Univ. (United States)
P. Milojkovik, George Mason Univ. (United States)
Jeremy T. Ekman, Univ. of North Carolina/Charlotte (United States)
Premanand Chandramani, Univ. of North Carolina/Charlotte (United States)
Richard G. Rozier, Univ. of North Carolina/Charlotte (United States)
Fouad E. Kiamilev, Univ. of North Carolina/Charlotte (United States)
Yue Liu, Honeywell Technology Ctr. (United States)
Mary K. Hibbs-Brenner, Honeywell Technology Ctr. (United States)
Jim Nohava, Honeywell Technology Ctr. (United States)
Edith Kalweit, Honeywell Technology Ctr. (United States)
Sommy Bounnak, Honeywell Technology Ctr. (United States)
Terry Marta, Honeywell Technology Ctr. (United States)
B. Walterson, Honeywell Technology Ctr. (United States)


Published in SPIE Proceedings Vol. 3288:
Optoelectronic Interconnects V
Ray T. Chen; Julian P. G. Bristow, Editor(s)

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