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Proceedings Paper

Application of total internal reflection microscopy for laser damage studies on fused silica
Author(s): Lynn Matthew Sheehan; Mark R. Kozlowski; David W. Camp
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Paper Abstract

Damage studies show that the majority of damage on UV grade fused silica initiates at the front or rear surface. The grinding and polishing processes used to produce the optical surfaces of transparent optics play a key role in the development of defects which can ultimately initiate damage. These defects can be on or breaking through the surface or can be sub-surface and surface defects in transparent materials. Images taken which compare both total internal reflection microscopy and atomic force microscopy show that the observed defects can be less than one micron in size. Total internal reflection microscopy has the added benefit of being able to observe large areas with sub-micron detection. Both off-line and in- situ systems have been applied in the Lawrence Livermore National Laboratory's damage laboratory in order to understand defects in the surface and subsurface of polished fused silica. There is a preliminary indication that TIRM quality can be related to the damage resistance. The in-situ microscope is coupled into a 355 nm, 7.5 ns, 10 Hz Nd:YAG laser system in order to study damage occurring at localized scatter sites revealed with the total internal reflection microscopy method. The tests indicate damage initiating at observed artifacts which have many different morphologies and damage behaviors. Some of the scatter sites and damage morphologies revealed have been related back to the finishing process.

Paper Details

Date Published: 20 April 1998
PDF: 14 pages
Proc. SPIE 3244, Laser-Induced Damage in Optical Materials: 1997, (20 April 1998); doi: 10.1117/12.307030
Show Author Affiliations
Lynn Matthew Sheehan, Lawrence Livermore National Lab. (United States)
Mark R. Kozlowski, Lawrence Livermore National Lab. (United States)
David W. Camp, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 3244:
Laser-Induced Damage in Optical Materials: 1997
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; M. J. Soileau, Editor(s)

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