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Proceedings Paper

Photothermal approach to local heating imaging: application to laser degradation
Author(s): R. Cherrak; Vincent Loriette; Benoit Claude Forget; Jean Paul Roger; D. Fournier; Albert Claude Boccara
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Paper Abstract

We use various probes to measure local temperature induced by internal or external heating of active or passive devices: Mirage detection can reveal heating of few ppb of the input power, whereas photothermal microscopy provides sub-micron spatial resolution. Temperature distribution is measured through periodic deflection or reflectivity mapping at frequencies high enough to confine heating near the source. Scanning InGaAsP/InP lasers facets, shows the weak influence of nonradiative recombination, in agreement with the high output power of these lasers before degradation. On strained-layer InGaAs quantum well lasers we obtained a drastic temperature rise, that we explain through simple model based on line heating for the laser cavity and point heating located at the facet. On a damaged laser the result, demonstrate clearly the existence of heating zones far from the facet along the laser cavity.

Paper Details

Date Published: 20 April 1998
PDF: 6 pages
Proc. SPIE 3244, Laser-Induced Damage in Optical Materials: 1997, (20 April 1998); doi: 10.1117/12.307026
Show Author Affiliations
R. Cherrak, ESPCI (France)
Vincent Loriette, ESPCI (France)
Benoit Claude Forget, ESPCI (France)
Jean Paul Roger, ESPCI (France)
D. Fournier, ESPCI (France)
Albert Claude Boccara, ESPCI (France)


Published in SPIE Proceedings Vol. 3244:
Laser-Induced Damage in Optical Materials: 1997
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; M. J. Soileau, Editor(s)

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