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Proceedings Paper

Semiconductor laser reliability
Author(s): Daniel P. Wilt
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Paper Abstract

In this paper, a review of the state-of-the-art in semiconductor laser diode reliability is presented, with a particular regard to the reliability of laser diodes used in long-distance telecommunication system. Remarkable advances in semiconductor laser reliability have been demonstrated over their thirty year history, leading to estimated median device lifetimes in excess of 100 years for most applications.

Paper Details

Date Published: 20 April 1998
PDF: 4 pages
Proc. SPIE 3244, Laser-Induced Damage in Optical Materials: 1997, (20 April 1998); doi: 10.1117/12.307023
Show Author Affiliations
Daniel P. Wilt, Lucent Technologies (United States)

Published in SPIE Proceedings Vol. 3244:
Laser-Induced Damage in Optical Materials: 1997
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; M. J. Soileau, Editor(s)

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