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Proceedings Paper

Toward the real threshold of the megajoule laser components
Author(s): Anne Fornier; C. Cordillot; D. Bernardino; B. Pinot; Bernard Geenen; Herve Leplan; W. Alexandre
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Paper Abstract

Large components typically 620 mm X 440 mm are needed to build up the LMJ (laser megajoule) which belongs to the future generation of the fusion laser. Today, the laboratory laser damage facilities allow to test small samples: generally witnesses with 50 mm in diameter. However, more of the test procedures are manually and small areas are examined. It means that usually just 20 and 50 sites are tested with a small Gaussian beam. Therefore, it is essential to verify if the large components needed for the fusion laser have the threshold above the requirements. It is also important to determine which law exists between the threshold of the witnesses samples and the threshold of the final components. In this paper, these problems are addressed in using the most powerful pulsed Nd:YAG laser in France. With this particular facility it becomes possible to test full scale optics on a few sites with a beam size diameter of 6 cm. Except the test on the real system, these kinds of experiments allow to observe the large beam damage morphologies. A study is at the beginning to try to find the scale law which linked the result obtained on the small witnesses with various methods. It also should lead to a procedure to qualify the full scale optics during the production time.

Paper Details

Date Published: 20 April 1998
PDF: 12 pages
Proc. SPIE 3244, Laser-Induced Damage in Optical Materials: 1997, (20 April 1998); doi: 10.1117/12.307002
Show Author Affiliations
Anne Fornier, Ctr. d'Etudes de Limeil-Valenton (France)
C. Cordillot, Ctr. d'Etudes de Limeil-Valenton (France)
D. Bernardino, Ctr. d'Etudes de Limeil-Valenton (France)
B. Pinot, REOSC (France)
Bernard Geenen, REOSC (France)
Herve Leplan, REOSC (France)
W. Alexandre, REOSC (France)


Published in SPIE Proceedings Vol. 3244:
Laser-Induced Damage in Optical Materials: 1997
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; M. J. Soileau, Editor(s)

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