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Proceedings Paper

Pulse-shape and pulse-length scaling of ns pulse laser damage threshold due to rate limiting by thermal conduction
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Paper Abstract

Assuming the observed scaling of laser damage threshold fluence with the (almost) square root of pulse duration is due to thermal conduction, we develop a formalism for directly comparing pulses of different shapes and durations. We find, for example, that a top hat pulse leads to 15% higher temperature (presumably 15% lower damage threshold) than a Gaussian pulse of the same fluence. We also find that the damage threshold of the expected NIF type pulse should be estimated from a Gaussian pulse with the same peak intensity. We find that the deviation of the scaling of damage threshold from square root of pulse duration has contributions from both the small but finite size of laser energy absorbers and from the temperature dependence of thermal properties. Keywords: laser damage, damage threshold, scaling, thermal conduction

Paper Details

Date Published: 20 April 1998
PDF: 6 pages
Proc. SPIE 3244, Laser-Induced Damage in Optical Materials: 1997, (20 April 1998); doi: 10.1117/12.306987
Show Author Affiliations
Michael D. Feit, Lawrence Livermore National Lab. (United States)
Alexander M. Rubenchik, Lawrence Livermore National Lab. (United States)
Alberto Salleo, Lawrence Livermore National Lab. (United States)
David Eimerl, Lawrence Livermore National Lab. (United States)


Published in SPIE Proceedings Vol. 3244:
Laser-Induced Damage in Optical Materials: 1997
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; M. J. Soileau, Editor(s)

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