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Proceedings Paper

Photothermal measuring techniques using pulsed laser
Author(s): Volker Neumann; Peter Meja; Bernhard Steiger
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Paper Abstract

An experimental set-up using different pulsed photothermal measuring techniques is presented. The set-up allows investigation of different optical components byu means of the photothermal reflectance microscopy, photothermal transmittance microscopy and the photothermal deflection microscopy both in reflection and transmission. The methods are based on different effects, such as a surface bending caused by thermally induced stress and thermal stress dependence of the refractive index. Therefore and in consequence of different reflectance's of the components, each photothermal techniques has different measuring sensitivity. The combination of several photothermal techniques allows an investigation of all optical component classes. Otherwise, more information could be determined about optical, thermal and mechanical properties of components. The experimental results of various optical components are presented. The absorbance, reflectance, transmittance and thermally conductivity are discussed on the basis of temporally measured signal curves. Thermally induced stress was also detected by means of the photothermal deflection microscopy in transmission.

Paper Details

Date Published: 20 April 1998
PDF: 8 pages
Proc. SPIE 3244, Laser-Induced Damage in Optical Materials: 1997, (20 April 1998); doi: 10.1117/12.306985
Show Author Affiliations
Volker Neumann, Hochschule fuer Technik und Wirtschaft Mittweida (Germany)
Peter Meja, Hochschule fuer Technik und Wirtschaft Mittweida (Germany)
Bernhard Steiger, Hochschule fuer Technik und Wirtschaft Mittweida (Germany)


Published in SPIE Proceedings Vol. 3244:
Laser-Induced Damage in Optical Materials: 1997
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; M. J. Soileau, Editor(s)

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