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Proceedings Paper

Roughness-induced absorption, scattering ellipsometry, and multidielectric resonances for laser damage investigation
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Paper Abstract

We present new improvements that were achieved at LOSCM Marseilles for a better characterization of optical thin films. Roughness-induced absorption, angular ellipsometry of light scattering and multidielectric resonances are discussed in multilayers. Theoretical and experimental results are given and new applications are emphasized.

Paper Details

Date Published: 20 April 1998
PDF: 14 pages
Proc. SPIE 3244, Laser-Induced Damage in Optical Materials: 1997, (20 April 1998); doi: 10.1117/12.306971
Show Author Affiliations
Claude Amra, Ecole National Superieure de Physique de Marseille (France)
Sophie Maure, Ecole National Superieure de Physique de Marseille (France)
Carole Deumie, Ecole National Superieure de Physique de Marseille (France)
Hugues Giovannini, Ecole National Superieure de Physique de Marseille (France)
Jean-Yves Natoli, Ecole National Superieure de Physique de Marseille (France)


Published in SPIE Proceedings Vol. 3244:
Laser-Induced Damage in Optical Materials: 1997
Gregory J. Exarhos; Arthur H. Guenther; Mark R. Kozlowski; M. J. Soileau, Editor(s)

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