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Proceedings Paper

Laser damage threshold and microfaultness of large KDP crystals
Author(s): Vitaly I. Salo; V. F. Tkachenko; M. A. Rom; Viacheslav M. Puzikov; Marina I. Kolybayeva
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Paper Abstract

The faulty microstructure of KDP samples having different bulk laser damage threshold (4 X 1010 W/cm2 - 5.4 X 1011 W/cm2 was studied using the methods of the three-crystal x-ray diffraction and two-crystal topography on reflection. A correlation between the dispersion of the structure-sensitive parameters characterizing the microfaultness and the value of bulk laser threshold of samples cut off large KDP crystals was established.

Paper Details

Date Published: 20 April 1998
PDF: 9 pages
Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); doi: 10.1117/12.306277
Show Author Affiliations
Vitaly I. Salo, Institute for Single Crystals (Ukraine)
V. F. Tkachenko, Institute for Single Crystals (Ukraine)
M. A. Rom, Institute for Single Crystals (Ukraine)
Viacheslav M. Puzikov, Institute for Single Crystals (Ukraine)
Marina I. Kolybayeva, Institute for Single Crystals (Ukraine)


Published in SPIE Proceedings Vol. 3359:
Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)

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