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Proceedings Paper

Measurement and spectrometry of fluxes of charged particles using a scintillator-photodiode-preamplifier (S-PD-PA) and new types of scintillators based on semiconductor AIIBVI compounds
Author(s): Vladimir D. Ryzhikov; Vyacheslav V. Chernikov; Leonid P. Gal'chinetsky; S. N. Galkin; Evgeniy A. Danshin; A. E. Filimonov; Elena K. Lisetskaya; V. G. Volkov
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Paper Abstract

Scintillators based on AIIBVI compounds, having relative small effective atomic numbers, can be used for measurement and spectrometry of fluxes of light and heavy charged particles. In this paper we attempted to specify the possibilities and limitations of the development of new types of solid-state detectors of charged particles and corresponding instruments on the basis of CdS(Te) and ZnSe(Te) scintillator single crystals produced by STC RI of the Concern `Institute for Single Crystals'. Principal attention was paid to a promising system S-PD-PA, combined with modern computer facilities. For the best specimens of instruments, we obtained energy resolution for alpha- particles with E(alpha ) equals 5.15 MeV R(alpha ) equals 4- 5%, for electrons with Ee equals 0.624 MeV equals Re equals 11-12%, alpha to beta ratio (alpha) /(gamma) equals 1.0 +/- 0.1, beta to gamma ratio (beta) /(gamma) - more than 100. A possibility is discussed of a combined method of detection and spectrometry of electrons in the energy range of 0.015 - 3.0 MeV using a windowless silicon PIN-PD (0.01 - 3.0 MeV), as well as a scintillation detector comprising a scintillator and a PIN-PD (0.2 - 3.0 MeV).

Paper Details

Date Published: 20 April 1998
PDF: 6 pages
Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); doi: 10.1117/12.306275
Show Author Affiliations
Vladimir D. Ryzhikov, Institute for Single Crystals (Ukraine)
Vyacheslav V. Chernikov, Institute for Single Crystals (Ukraine)
Leonid P. Gal'chinetsky, Institute for Single Crystals (Ukraine)
S. N. Galkin, Institute for Single Crystals (Ukraine)
Evgeniy A. Danshin, Institute for Single Crystals (Ukraine)
A. E. Filimonov, Institute for Single Crystals (Ukraine)
Elena K. Lisetskaya, Institute for Single Crystals (Ukraine)
V. G. Volkov, Institute for Single Crystals (Ukraine)

Published in SPIE Proceedings Vol. 3359:
Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)

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