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Proceedings Paper

Use of photodepolarization spectra for diagnostics and characterization of alternating current thin-film electroluminescent (ACTFEL) devices
Author(s): Nataliya A. Vlasenko; A. I. Beletskii; Z. L. Denisova; Ya. F. Kononets; L. I. Veligura
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Paper Abstract

New non-destructive method of diagnostics and characterization of ACTFEL devices based on analysis of experimental and calculated photodepolarization spectra is proposed. This method gives an important information concerning the signa nd spatial distribution of polarization charge which influence significantly on characteristics of ACTFEL devices. The methodology and various variants of the method are considered. The simulation of PDP spectra is provided. Capabilities of the method are illustrated by the PDP spectra of ZnS:Mn and SrS:Ce devices fabricated by various techniques.

Paper Details

Date Published: 20 April 1998
PDF: 7 pages
Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); doi: 10.1117/12.306271
Show Author Affiliations
Nataliya A. Vlasenko, Institute of Semiconductor Physics (Ukraine)
A. I. Beletskii, Institute of Semiconductor Physics (Ukraine)
Z. L. Denisova, Institute of Semiconductor Physics (Ukraine)
Ya. F. Kononets, Institute of Semiconductor Physics (Ukraine)
L. I. Veligura, Institute of Semiconductor Physics (Ukraine)


Published in SPIE Proceedings Vol. 3359:
Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)

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