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Proceedings Paper

Characterization of layered structures by photoacoustic piezoelectric technique
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Paper Abstract

A thermoelastic response that arises in a two-layered wafer under its heating by periodically modulated light beam has been studied theoretically. For the case of piezoelectric detection of the signal an analytical expression for the output voltage of the transducer has been obtained which allows to calculate the amplitude and phase characteristics versus modulation frequency. It is shown that these characteristics vary strongly depending on thermal and elastic properties of both layers.

Paper Details

Date Published: 20 April 1998
PDF: 6 pages
Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); doi: 10.1117/12.306266
Show Author Affiliations
Margarita L. Shendeleva, Institute of Physics (Ukraine)


Published in SPIE Proceedings Vol. 3359:
Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)

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