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Proceedings Paper

Vacuum-thermal-deposited films of organic dyes as sensitive materials in electrodigit visualization processes
Author(s): J. A. Zhizhenko; Vladimir Enokovich Agabekov; Yu. K. Mikhailovskii; E. V. Kotov
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Paper Abstract

The method of electrodigit diagnostics is based on registration of a picture luminescence of object, placed in a high-frequency high-voltage field. It lets to reveal surface heterogeneity of a various nature, defects conductor under a layer optical opaque dielectric or in most dielectric. Early it is offered to replace traditionally used in this method halogensilver materials for vacuum thermal deposition (VTD) on dielectric of a substrate by thin layers organic dyes, that will make a method more technological and cheap. In the given work the spectral methods have qualitatively appreciated a role making of (electronic, x-ray, ultraviolet and visible radiations) in formation of the electrodigit image in VTD-films of Rhodamine 6G (R-6G) and dye of a class Oxazine (OX-1). It is established, that: (1) the contribution all making (except UV-radiation) in formation of a drawing in VTD-films of R-6G and OX-1 is insignificant; (2) the visible image in a VTD- film of R-6G will be formed for the account of decomposition of dye by `rigid' UV-radiation; (3) the influence of 1 sec. of the crown discharge on 0,68-micrometers a VTD-film of OX-1 is equivalent of irradiation her 365 nm by a doze 0,8 J/cm2.

Paper Details

Date Published: 20 April 1998
PDF: 8 pages
Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); doi: 10.1117/12.306263
Show Author Affiliations
J. A. Zhizhenko, Institute of Physical Organic Chemistry (Belarus)
Vladimir Enokovich Agabekov, Institute of Physical Organic Chemistry (Belarus)
Yu. K. Mikhailovskii, Institute of Physical Organic Chemistry (Belarus)
E. V. Kotov, Institute of Physical Organic Chemistry (Belarus)


Published in SPIE Proceedings Vol. 3359:
Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997

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