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Proceedings Paper

Diagnostics of noncrystalline films by using interference of Raman signals in thin and superthin films
Author(s): Vladymyr M. Mitsa
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Paper Abstract

The depth dependence of Raman spectra of a-GeS2-type films having a different optical thickness ((lambda) /4 and (lambda) /2) and their refractive index have been investigated. The model of a layered-inhomogeneous structure of film has been proposed. There have been distinguished: near-surface region (up to 50 angstroms), central part and transition film-substrate region (up to 300 angstroms).

Paper Details

Date Published: 20 April 1998
PDF: 4 pages
Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); doi: 10.1117/12.306250
Show Author Affiliations
Vladymyr M. Mitsa, Uzhgorod State Univ. (Ukraine)


Published in SPIE Proceedings Vol. 3359:
Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)

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