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Proceedings Paper

Optical properties of thin Al films studied by ordinary and polariton spectroellipsometry
Author(s): Igor A. Shaikevich; Pavel V. Kolesnik; Victoria Pas'ko; Vasiliy V. Prorok
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Paper Abstract

The new technique of measurements of the ellipsometric parameters and the optical constants of the thin metallic films with excitation of surface polaritons by Kretschman method is elaborated. It is shown that unlike the some authors' opinion both the excitation of the polaritons on the opposite to the illuminated side and the detection of the polaritons are possible for the film with thickness less than 30 nm.

Paper Details

Date Published: 20 April 1998
PDF: 5 pages
Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); doi: 10.1117/12.306232
Show Author Affiliations
Igor A. Shaikevich, Kiev Univ. (Ukraine)
Pavel V. Kolesnik, Kiev Univ. (Ukraine)
Victoria Pas'ko, Kiev Univ. (Ukraine)
Vasiliy V. Prorok, Kiev Univ. (Ukraine)


Published in SPIE Proceedings Vol. 3359:
Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)

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