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Proceedings Paper

Short-wave emission of Tb3+ as an optical indicator of TFELS matrix changes
Author(s): V. S. Khomchenko; V. E. Rodionov; Yu. A. Tzirkunov
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Paper Abstract

It is shown that short-wave emission of Tb3+ may be using as an optical indicator of thin film electroluminescent structures matrix changes because that emission shows a high spectral response to the crystal field symmetry change near Tb3+ ion. Depending on the conditions of preparation of the film, the annealing temperature, the action of the gamma-ray radiation of the Tb3+ electroluminescent spectra's view corroborates the conclusion. Electroluminescent long-wave part spectra compared with short-wave part spectra at T equals 4.2 divided by 300 K regarding the dependence on film preparation conditions. Such comparisons demonstrate an advantage of using over `green' emission of `violet' emission terbium as an optical indicator.

Paper Details

Date Published: 20 April 1998
PDF: 6 pages
Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); doi: 10.1117/12.306226
Show Author Affiliations
V. S. Khomchenko, Institute of Semiconductor Physics (Ukraine)
V. E. Rodionov, Institute of Semiconductor Physics (Ukraine)
Yu. A. Tzirkunov, Institute of Semiconductor Physics (Ukraine)


Published in SPIE Proceedings Vol. 3359:
Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)

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