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Proceedings Paper

Optical methods of control and characterization of materials for infrared detectors
Author(s): Yuri V. Vorobiev; Jesus Gonzalez-Hernandez; Martin Yanez-Limon; Juan Francisco Perez-Robles; Francisco J. Espinoza-Beltran; Rafael Ramirez-Bon; Valery N. Zakharchenko; Roman V. Zakharchenko
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Paper Abstract

A brief review is made of some classic and novel experimental techniques allowing the determination of the main parameters of semiconducting materials with the application of purely optical excitation. Among them some modifications of the photothermoacoustical method (in particular, with the pulse excitation), plasma reflection, sample scanning with the intense light beam.

Paper Details

Date Published: 20 April 1998
PDF: 6 pages
Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); doi: 10.1117/12.306201
Show Author Affiliations
Yuri V. Vorobiev, Univ. of Queretaro (Mexico)
Jesus Gonzalez-Hernandez, Univ. of Queretaro (Mexico)
Martin Yanez-Limon, Univ. of Queretaro (Mexico)
Juan Francisco Perez-Robles, Univ. of Queretaro (Mexico)
Francisco J. Espinoza-Beltran, Univ. of Sonora (Mexico)
Rafael Ramirez-Bon, Univ. of Sonora (Mexico)
Valery N. Zakharchenko, National Technical Univ. of Ukraine (Ukraine)
Roman V. Zakharchenko, National Technical Univ. of Ukraine (Ukraine)


Published in SPIE Proceedings Vol. 3359:
Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)

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