Share Email Print
cover

Proceedings Paper

Monitoring the aging of high-power laser diode arrays
Author(s): Jens Wolfgang Tomm; A. Baerwolff; Christoph Lienau; Alexander Richter; A. Jaeger; J. Donecker; A. Gerhardt; Franz X. Daiminger; Stefan Heinemann
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Different diagnostic methods were investigated in order to evaluate their potential as aging sensitive tool for the analysis of high-power laser diode arrays. The well-known method of photocurrent spectroscopy, i.e. the measurement of the spectral sensitivity of a laser diode acting as a detector, was found to monitor aging properties of high power laser diode arrays in a convenient way. Photocurrent spectra of high power laser diode arrays emitting at 808 nm (1.53 eV) were investigated in the 0.8 - 3.0 eV photon energy range. Aging induced changes in different spectral regions reveal the influence of difference mechanisms affecting the structure. One aging effect--the growth of the defect concentration within the optically active layers of the devices--is monitored. Conclusions on the microscopic nature of the changes are drawn and several applications are discussed.

Paper Details

Date Published: 20 April 1998
PDF: 12 pages
Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); doi: 10.1117/12.306188
Show Author Affiliations
Jens Wolfgang Tomm, Max-Born-Institut fuer Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
A. Baerwolff, Max-Born-Institut fuer Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
Christoph Lienau, Max-Born-Institut fuer Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
Alexander Richter, Max-Born-Institut fuer Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
A. Jaeger, Max-Born-Institut fuer Nichtlineare Optik und Kurzzeitspektroskopie (Germany)
J. Donecker, Institut fuer Kristallzuechtung (Germany)
A. Gerhardt, Institut fuer Kristallzuechtung (Germany)
Franz X. Daiminger, Jenoptik Laserdiode GmbH (Germany)
Stefan Heinemann, Jenoptik Laserdiode GmbH (United States)


Published in SPIE Proceedings Vol. 3359:
Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997

© SPIE. Terms of Use
Back to Top