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Coherent control in bulk and nanostructure semiconductors
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Paper Abstract

Laser light has been used as a probe of atoms, molecules, and solids since the invention of the laser. The use of laser light in a more active role, to modify and process surfaces, and initiate chemical reactions, followed shortly thereafter. But usually it is the intensity and the directionality of the laser light that is employed, not necessarily its coherence, and not particularly the fact that it has a well-defined phase. 'Coherence control' can be broadly understood as the set of processes whereby light modifies matter in a way that is critically dependent on the incident light beams possessing well-defined phases. While in a laser matter is manipulated to produce light of the desired properties, in coherent control light is manipulated -- in particular, its phase and intensity is adjusted -- to produce a material response of the desired type. Of the various coherent control processes that are currently being investigated, some involve a transition in the material medium from an initial state to a final state by two or more possible processes. With each of these is associated a quantum mechanical amplitude, and hence the probability for the transition can show interference effects between the two amplitudes, just as in the familiar two-slit interference experiment the probability for the electron to be observed at a given position involves a probability that is the square of the sum of two amplitudes. In quantum interference control (QUIC), the relative phase of the two amplitudes is adjusted by adjusting the relative phase of two polarizations of a single beam, or the relative phase of two beams at different frequencies. It is this particular type of coherent control that is of interest in this communication.

Paper Details

Date Published: 23 April 1998
PDF: 5 pages
Proc. SPIE 3277, Ultrafast Phenomena in Semiconductors II, (23 April 1998); doi: 10.1117/12.306172
Show Author Affiliations
John E. Sipe, Univ. of Toronto and Photonics Research Ontario (Canada)
Henry M. van Driel, Univ. of Toronto and Photonics Research Ontario (Canada)

Published in SPIE Proceedings Vol. 3277:
Ultrafast Phenomena in Semiconductors II
Kong-Thon F. Tsen; Harold R. Fetterman, Editor(s)

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