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Proceedings Paper

Ultrafast measurements of electric fields in semiconductors by optical harmonic generation
Author(s): Ajay Nahata; Tony F. Heinz; James A. Misewich
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Paper Abstract

We describe the application of an optical second-harmonic sampling technique that allows for the detection of subpicosecond electrical transients.

Paper Details

Date Published: 23 April 1998
PDF: 6 pages
Proc. SPIE 3277, Ultrafast Phenomena in Semiconductors II, (23 April 1998); doi: 10.1117/12.306161
Show Author Affiliations
Ajay Nahata, Columbia Univ. (United States)
Tony F. Heinz, Columbia Univ. (United States)
James A. Misewich, IBM Thomas J. Watson Research Ctr. (United States)


Published in SPIE Proceedings Vol. 3277:
Ultrafast Phenomena in Semiconductors II
Kong-Thon F. Tsen; Harold R. Fetterman, Editor(s)

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