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Proceedings Paper

Frequency dispersion and field dependence in the thickness mode material constants of PVDF-TRFE copolymers made by AMP Sensors Ltd.
Author(s): Stewart Sherrit; J. E. Haysom; Harvey D. Wiederick; Benoy K. Mukherjee; Michael Sayer
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Paper Abstract

A set of thickness resonators of PVDF-TrFE copolymer have been characterized as a function of the frequency and DC bias. The first six resonance peaks in the impedance spectra were analyzed to determine the degree of frequency dispersion in the complex elastic, piezoelectric, and dielectric constants. Modeling the dispersion in the material constants as a polynomial in the frequency f produced an excellent fit to the data over the 1 - 30 MHz frequency range. The samples were then tested for non- linearity by analyzing the fundamental resonance as a function of a DC bias field. The field dependence of the PVDF-TrFE samples was much smaller than for comparable samples of a soft PZT.

Paper Details

Date Published: 16 April 1998
PDF: 10 pages
Proc. SPIE 3321, 1996 Symposium on Smart Materials, Structures, and MEMS, (16 April 1998); doi: 10.1117/12.305622
Show Author Affiliations
Stewart Sherrit, Royal Military College of Canada (Canada)
J. E. Haysom, Royal Military College of Canada (Canada)
Harvey D. Wiederick, Royal Military College of Canada (Canada)
Benoy K. Mukherjee, Royal Military College of Canada (Canada)
Michael Sayer, Queen's Univ. (Canada)

Published in SPIE Proceedings Vol. 3321:
1996 Symposium on Smart Materials, Structures, and MEMS
Vasu K. Aatre; Vijay K. Varadan; Vasundara V. Varadan, Editor(s)

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