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Proceedings Paper

Stress analysis of piezoceramics with defects
Author(s): R. K. Nimal D. Rajapakse
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Paper Abstract

An accurate and efficient indirect boundary element method is presented to analyze the electroelastic fields in piezoceramics with defects in the form of voids or openings. Stress concentration around the void can be studied by using the present method for defects of arbitrary geometry and orientation. The case of multiple voids can also be analyzed without any complexity. The integral equation is based on 2D Green's functions for a piezoceramic solid under plane strain or stress conditions. Closed form solutions for Green's functions are used in this study to enhance both the numerical efficiency and accuracy. Selected numerical results for an elliptical cavity are presented. The present methodology is useful in estimating stress concentrations in piezoceramic components used in the fabrication of smart structures.

Paper Details

Date Published: 16 April 1998
PDF: 10 pages
Proc. SPIE 3321, 1996 Symposium on Smart Materials, Structures, and MEMS, (16 April 1998); doi: 10.1117/12.305601
Show Author Affiliations
R. K. Nimal D. Rajapakse, Univ. of Manitoba (Canada)


Published in SPIE Proceedings Vol. 3321:
1996 Symposium on Smart Materials, Structures, and MEMS
Vasu K. Aatre; Vijay K. Varadan; Vasundara V. Varadan, Editor(s)

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