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Proceedings Paper

AC/DC field relaxation in multilayer polymer devices: analysis and applications
Author(s): Yongqiang Shi; Wenshen Wang; Weiping Lin; David J. Olson; James H. Bechtel
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Paper Abstract

Electric field distribution and relaxation in a multi-layer polymer system are analyzed based on electromagnetic theory. Analysis showed that the steady state DC electric fields across polymer layers depend on the conductivity of each layer. When a step DC voltage is applied to the electrodes, the field across the waveguide layer will relax exponentially from an initial state to a steady state depending on the dielectric constants and conductivities of polymers. The AC field distribution generally depends on the dielectric constants of the polymer layers at high frequency. At low frequency, the AC field distribution is frequency dependent, and a phase delay occurs. To eliminate the AC/DC field relaxation, the materials used must have matching dielectric properties. The relaxation time (tau) of each polymer layer must be equal at the operating conditions. The analysis of the field relaxation can be applied to the design, fabrication, and test of electro-optic polymer devices. The field relaxation in multi-layer polymers can affect the device bias and operation stability in practical applications. Experimental results showed that stable DC bias can be achieved by optimizing or matching relaxation properties of polymers. Other applications of the field relaxation analysis include polymer poling, device characterization, and new device designs.

Paper Details

Date Published: 17 April 1998
PDF: 9 pages
Proc. SPIE 3281, Polymer Photonic Devices, (17 April 1998); doi: 10.1117/12.305411
Show Author Affiliations
Yongqiang Shi, TACAN Corp. (United States)
Wenshen Wang, TACAN Corp. (United States)
Weiping Lin, TACAN Corp. (United States)
David J. Olson, TACAN Corp. (United States)
James H. Bechtel, TACAN Corp. (United States)


Published in SPIE Proceedings Vol. 3281:
Polymer Photonic Devices
Bernard Kippelen; Donal D. C. Bradley, Editor(s)

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