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Proceedings Paper

Optical coherence microscopy for the in-depth study of biological structures: system based on a parallel detection scheme
Author(s): Emmanuel Beaurepaire; Philippe Gleyzes; Martial Lebec; Loic Blanchot; Herve Saint-Jalmes; Albert Claude Boccara
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Paper Abstract

We present a new microscopy system based on the OCT principle, that uses a multiplexed lock-in detection scheme to generate a 2D head-on image in parallel without lateral scanning. Our 'full-field optical coherence microscopy' comprises a Michelson interferometer built with a polarizing beam splitter, and uses a photoelastic birefringence modulator to modulate the optical path difference between the two orthogonal polarizations. A novel signal processing method is used to achieve a demodulation in parallel on every pixel of a 256 X 256 CCD camera. A 840 nm electroluminescent diode with 20 micrometers coherence length is used to illuminate the field of view through the microscope objective lens. In-depth exploration of the sample is realized by changing the plane of focus. The lateral resolution of the images is limited by the camera pixel size and is 2 micrometers . The axial sectioning ability is approximately 8 micrometers . Having validated our setup on model samples, we now evaluate its performance on biological structures. As an example, images of onion cells from 50-400 micrometers below the surface are obtained in 1 s with 100 dB sensitivity.

Paper Details

Date Published: 16 April 1998
PDF: 8 pages
Proc. SPIE 3250, Optical Biopsy II, (16 April 1998); doi: 10.1117/12.305380
Show Author Affiliations
Emmanuel Beaurepaire, Ecole Superieure de Physique et Chimie Industrielles (France)
Philippe Gleyzes, Ecole Superieure de Physique et Chimie Industrielles (France)
Martial Lebec, Univ. Paris XII (France)
Loic Blanchot, Univ. Paris XII (France)
Herve Saint-Jalmes, Univ. Paris XII (France)
Albert Claude Boccara, Ecole Superieure de Physique et Chimie Industrielles (France)


Published in SPIE Proceedings Vol. 3250:
Optical Biopsy II
Robert R. Alfano, Editor(s)

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