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Proceedings Paper

Electromagnetic microscope compared with a conventional pulsed eddy-current probe
Author(s): Walter N. Podney
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Paper Abstract

A superconductive probe presently can detect a crack at a rivet hole that is two to three times smaller than the smallest crack detectable by a conventional probe. As the technology matures and noise resolution approaches a limit set by SQUIDS, approximately 1 fH, it will enable detecting submillimeter cracks down to approximately 15 mm.

Paper Details

Date Published: 31 March 1998
PDF: 12 pages
Proc. SPIE 3397, Nondestructive Evaluation of Aging Aircraft, Airports, and Aerospace Hardware II, (31 March 1998); doi: 10.1117/12.305058
Show Author Affiliations
Walter N. Podney, SQM Technology, Inc. (United States)


Published in SPIE Proceedings Vol. 3397:
Nondestructive Evaluation of Aging Aircraft, Airports, and Aerospace Hardware II
Glenn A. Geithman; Gary E. Georgeson, Editor(s)

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