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Proceedings Paper

Optical metrology for industrialization of optical information processing
Author(s): David P. Casasent; Charles L. Wilson
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Paper Abstract

One of the major barriers to commercial application of optical technology to information processing is the high cost of system development and manufacture. This problem has been solved in other industries through the use of computer aided design (CAD) and integration of system design with manufacturing. The development of better system level metrology is needed to allow more computer-based methods to be used in this process. As a test case, we are designing an optical pattern recognition system to be performed on an input image (at video rates) versus a large reference set, for example 1000 faces, with images of 640 by 480 pixels or larger. We have constructed both an optical pattern recognition system and a holographic memory system which we have instrumented and used to address the metrological needs of these applications. This has allowed us to evaluate the level of system and component level metrology needed for real-time video processing. This report addressed the metrological issues encountered in building and testing these systems.

Paper Details

Date Published: 23 March 1998
PDF: 12 pages
Proc. SPIE 3386, Optical Pattern Recognition IX, (23 March 1998); doi: 10.1117/12.304750
Show Author Affiliations
David P. Casasent, Carnegie Mellon Univ. (United States)
Charles L. Wilson, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 3386:
Optical Pattern Recognition IX
David P. Casasent; Tien-Hsin Chao, Editor(s)

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