Share Email Print

Proceedings Paper

Thermal inspection of SiC/SiC ceramic matrix composites
Author(s): Robert Osiander; Jane W. Maclachlan Spicer; Jay M. Amos
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Measurements of both through-thickness and lateral thermal diffusivities are described for a SiC/SiC ceramic matrix composite material. The measurement approach is one-sided and is based on the time-resolved IR radiometry method in which the specimen is illuminated with a step heating pulse and the resulting temperature rise is monitored with an IR focal plane array. An area heating source is used for the through-thickness measurement of thermal diffusivity and a line source is used for the lateral thermal diffusivity measurement. The result indicate that the thermal diffusivity values obtained using a model assuming surface absorption and emission have to be corrected since the composites show some IR transparency accompanied by strong scattering. Additional measurements are presented on CMC components structures with possible porosity at bonds.

Paper Details

Date Published: 26 March 1998
PDF: 11 pages
Proc. SPIE 3361, Thermosense XX, (26 March 1998); doi: 10.1117/12.304748
Show Author Affiliations
Robert Osiander, Johns Hopkins Univ. (United States)
Jane W. Maclachlan Spicer, Johns Hopkins Univ. (United States)
Jay M. Amos, Pratt & Whitney (United States)

Published in SPIE Proceedings Vol. 3361:
Thermosense XX
John R. Snell; Richard Norman Wurzbach, Editor(s)

© SPIE. Terms of Use
Back to Top