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Proceedings Paper

Advanced image processing for defect visualization in infrared thermography
Author(s): Yuri A. Plotnikov; William P. Winfree
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Paper Abstract

Results of a defect visualization process based on pulse IR thermography are presented. Algorithms have been developed to reduce the amount of operator participation required in the process of interpreting thermographic images. The algorithms determine the defect's depth and size from the temporal and spatial thermal distributions that exist on the surface of the investigated object following thermal excitation. A comparison of the result from thermal contrast, time derivative, and phase analysis methods for defect visualization are presented. These comparisons are based on 3D simulations of a test case representing a plate with multiple delaminations. Comparisons are also based on experimental data obtained from a specimen with flat bottom holes and a composite panel with delaminations.

Paper Details

Date Published: 26 March 1998
PDF: 8 pages
Proc. SPIE 3361, Thermosense XX, (26 March 1998); doi: 10.1117/12.304745
Show Author Affiliations
Yuri A. Plotnikov, NASA Langley Research Ctr. (United States)
William P. Winfree, NASA Langley Research Ctr. (United States)

Published in SPIE Proceedings Vol. 3361:
Thermosense XX
John R. Snell; Richard Norman Wurzbach, Editor(s)

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