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Proceedings Paper

Online industrial thermography of die casting tooling using dual-wavelength IR imaging
Author(s): Helen E. Kourous; Behrouz N. Shabestari; Spencer D. Luster; Jaroslaw P. Sacha
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Paper Abstract

Recent advances in IR system technology coupled with significant reduction sin cost are making thermography a viable tool for on-line monitoring of industrial processes. This paper describes the implementation of a novel rugged thermal imaging system based on a dual-wavelength technique for a large intelligent process monitoring project. The objective of the portion described herein is to deploy a non-contact means of monitoring die cast tooling surface thermal conditions and analyzing the data in the context of the process monitor. The technical and practical challenges of developing such a non-contact thermal measurement system for continuous inspection in an industrial environment are discussed, and methods of resolving them are presented. These challenges include implementation of a wavelength filter system for quantitative determination of the surface temperature. Additionally, emissivity variations of the tooling surface as well as IR reflections are discussed. The primary issues that are addressed, however, are compensation for ambient temperature conditions and optimization of the calibration process. Other issues center on remote camera control, image acquisition, data synchronization, and data interpretation. An example application of this system, along with in-plant images and thermal data, is described.

Paper Details

Date Published: 26 March 1998
PDF: 10 pages
Proc. SPIE 3361, Thermosense XX, (26 March 1998); doi: 10.1117/12.304731
Show Author Affiliations
Helen E. Kourous, Edison Industrial Systems Ctr. (United States)
Behrouz N. Shabestari, Edison Industrial Systems Ctr. (United States)
Spencer D. Luster, Edison Industrial Systems Ctr. (United States)
Jaroslaw P. Sacha, Edison Industrial Systems Ctr. (United States)

Published in SPIE Proceedings Vol. 3361:
Thermosense XX
John R. Snell; Richard Norman Wurzbach, Editor(s)

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