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Proceedings Paper

Tracking rotating components for complete construction of simulated images
Author(s): David T. Sass; Joseph D. White; Teresa G. Gonda; Jack C. Jones
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Paper Abstract

Visual and IR imaging of rotating objects, such as tires under load test conditions is desirable but presents several obstacles, such as blurring and component obstruction. If an imaging system capable of high enough frame rates to capture the data without aliasing effects is used, the entire object is often not in view and therefore could not be analyzed. The authors present a system that uses a standard Inframetrics 760 to synthetically reconstruct an image by using high speed imaging techniques in conjunction with a shaft encoder, rotational tracking, and specialized data sampling software to capture three sides of a tire that is being tested at 50 mph. This process has proven valuable in providing non-intrusive thermal analysis in recent quality tests of tires. Current accepted testing techniques for tires include endurance test and x-ray. Both provide limited information, but neither provides the thermal information that is a dominant factor in tire failure. By setting the IR camera in a position to face the edge of the tire, using mirrors to bring the sidewall into the field of view, and using our methodology we have collected data on the entire tire under two minutes. This data can be viewed as flat data array images or rendered onto a 3D wireframe representation.

Paper Details

Date Published: 26 March 1998
PDF: 6 pages
Proc. SPIE 3361, Thermosense XX, (26 March 1998); doi: 10.1117/12.304730
Show Author Affiliations
David T. Sass, U.S. Army Tank-Automotive and Armaments Command (United States)
Joseph D. White, U.S. Army Tank-Automotive and Armaments Command (United States)
Teresa G. Gonda, U.S. Army Tank-Automotive and Armaments Command (United States)
Jack C. Jones, U.S. Army Tank-Automotive and Armaments Command (United States)


Published in SPIE Proceedings Vol. 3361:
Thermosense XX
John R. Snell; Richard Norman Wurzbach, Editor(s)

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